BS EN 60749-26-2006 半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.人体模型(HBM)
作者:标准资料网 时间:2024-05-17 02:22:44 浏览:8027
来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Electrostaticdischarge(ESD)sensitivitytesting-Humanbodymodel(HBM)
【原文标准名称】:半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.人体模型(HBM)
【标准号】:BSEN60749-26-2006
【标准状态】:现行
【国别】:英国
【发布日期】:2006-09-29
【实施或试行日期】:2006-09-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;检验设备;分类;分类系统;气候;气候试验;元部件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备和元件;静电的;静电放电;静电学;环境;环境测试;环境试验;故障;易燃性;热学;人体;脉冲荷载能力;集成电路;测量设备;机械测试;模型;潮气;耐力;半导体器件;半导体;模拟;温度;测试;测试装置;外观检查(测试)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Checkingequipment;Classification;Classificationsystems;Climate;Climatictests;Components;Definition;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Failure;Flammability;Heat;Humanbody;Impulseloadability;Integratedcircuits;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedhumanbodymodel(HBM)electrostaticdischarge(ESD).Theobjectiveistoprovidereliable,repeatableHBMESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,themachinemodel(MM)testmethod(seeIEC60749-27)orotherESDtestmethodsintheIEC60749series.TheHBMandMMtestmethodsproducesimilarbutnotidenticalresults;unlessotherwisespecified,thistestmethodistheoneselected.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:18P;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.人体模型(HBM)
【标准号】:BSEN60749-26-2006
【标准状态】:现行
【国别】:英国
【发布日期】:2006-09-29
【实施或试行日期】:2006-09-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;检验设备;分类;分类系统;气候;气候试验;元部件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备和元件;静电的;静电放电;静电学;环境;环境测试;环境试验;故障;易燃性;热学;人体;脉冲荷载能力;集成电路;测量设备;机械测试;模型;潮气;耐力;半导体器件;半导体;模拟;温度;测试;测试装置;外观检查(测试)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Checkingequipment;Classification;Classificationsystems;Climate;Climatictests;Components;Definition;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Failure;Flammability;Heat;Humanbody;Impulseloadability;Integratedcircuits;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedhumanbodymodel(HBM)electrostaticdischarge(ESD).Theobjectiveistoprovidereliable,repeatableHBMESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,themachinemodel(MM)testmethod(seeIEC60749-27)orotherESDtestmethodsintheIEC60749series.TheHBMandMMtestmethodsproducesimilarbutnotidenticalresults;unlessotherwisespecified,thistestmethodistheoneselected.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:18P;A4
【正文语种】:英语
下载地址: 点击此处下载